X-ray Imaging Using a Hybrid Photon Counting GaAs Pixel Detector

Details X-ray Imaging Using a Hybrid Photon Counting GaAs Pixel Detector X-ray Imaging Using a Hybrid Photon Counting GaAs Pixel Detector

1998-12-21

arxiv.org/abs/physics/9812039v1

Nucl.Phys.Proc.Suppl.78:491-496,1999

Physics

Instrumentation and Detectors

6 pages, 7 figures, uses espcrc2.sty, submitted to Proc. of 6th Int. Conference on Advanced Technology, and Particle Physics,

Scientific paper

10.1016/S0920-5632(99)00592-7

The performance of hybrid GaAs pixel detectors as X-ray imaging sensors were investigated at room temperature. These hybrids consist of 300 mu-m thick GaAs pixel detectors, flip-chip bonded to a CMOS Single Photon Counting Chip (PCC). This chip consists of a matrix of 64 x 64 identical square pixels (170 mu-m x 170 mu-m) and covers a total area of 1.2 cm**2. The electronics in each cell comprises a preamplifier, a discriminator with a 3-bit threshold adjust and a 15-bit counter. The detector is realized by an array of Schottky diodes processed on semi-insulating LEC-GaAs bulk material. An IV-charcteristic and a detector bias voltage scan showed that the detector can be operated with voltages around 200 V. Images of various objects were taken by using a standard X-ray tube for dental diagnostics. The signal to noise ratio (SNR) was also determined. The applications of these imaging systems range from medical applications like digital mammography or dental X-ray diagnostics to non destructive material testing (NDT). Because of the separation of detector and readout chip, different materials can be investigated and compared.

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