Worst-Case and Average-Case Analysis of n-Detection Test Sets

Details Worst-Case and Average-Case Analysis of n-Detection Test Sets Worst-Case and Average-Case Analysis of n-Detection Test Sets

2007-10-25

arxiv.org/abs/0710.4735v1

Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Computer Science

Hardware Architecture

Submitted on behalf of EDAA (http://www.edaa.com/)

Scientific paper

Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform both a worst-case analysis and an average-case analysis to check the effect of restricting n on the unmodeled fault coverage of an (arbitrary) n-detection test set. Our analysis is independent of any particular test set or test generation approach. It is based on a specific set of target faults and a specific set of untargeted faults. It shows that, depending on the circuit, very large values of n may be needed to guarantee the detection of all the untargeted faults. We discuss the implications of these results.

Affiliated with

Also associated with

No associations

Rating

Worst-Case and Average-Case Analysis of n-Detection Test Sets does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Worst-Case and Average-Case Analysis of n-Detection Test Sets, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Worst-Case and Average-Case Analysis of n-Detection Test Sets will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-432269