White light interferometer for measuring polarization extinction ratio

Details White light interferometer for measuring polarization extinction ratio White light interferometer for measuring polarization extinction ratio

Jan 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992spie.1553...14w&link_type=abstract

Proc. SPIE Vol. 1553, p. 14-22, Laser Interferometry IV: Computer-Aided Interferometry, Ryszard J. Pryputniewicz; Ed.

Physics

Optics

Scientific paper

A white light interferometer was developed for measuring polarization extinction ratios in proton-exchanged, integrated-optic (IO) chips. Usually, such measurements require expensive strain-free polarization components. The instrument which was developed at United Technologies Research Center measured extinction ratios in excess of 95 dB using only interferometric quality optics. The system used a superluminescent diode operating at 825 nanometers as the illumination source and two interferometers combined in series, a measurement interferometer and an analyzing interferometer. The measurement interferometer relied upon the two axes of polarization in the IO chip having different optical pathlengths and the analyzing interferometer was a modified Mach-Zehnder. Results using this system on the IO chips showed that the extinction ratio was 58 dB.

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