Use of x-ray optical systems in a small diffractometer

Details Use of x-ray optical systems in a small diffractometer Use of x-ray optical systems in a small diffractometer

Nov 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3444..498l&link_type=abstract

Proc. SPIE Vol. 3444, p. 498-500, X-Ray Optics, Instruments, and Missions, Richard B. Hoover; Arthur B. Walker; Eds.

Physics

Optics

Scientific paper

The use of Kumakhov halflenses in a small diffractometers with position-sensitive detector for the investigation of stress-deformation state is considered. The possibility of obtaining the system of parallel beam with a small angular divergence allows to estimate the state of stress- deformation in a various sections of object under investigation, owing to drawing near or moving away x-ray tube connected with the halflens. It is shown, that the new method should be very interesting for determination of the reliability of a real articles.

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