Use of Raman spectroscopy in the characterization of soft x-ray multilayer reflectors

Details Use of Raman spectroscopy in the characterization of soft x-ray multilayer reflectors Use of Raman spectroscopy in the characterization of soft x-ray multilayer reflectors

Jul 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1160..229q&link_type=toc

Proc. SPIE Vol. 1160, p. 229-0, X-Ray/EUV Optics for Astronomy and Microscopy, Richard B. Hoover; Ed.

Physics

Optics

1

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