Astronomy and Astrophysics – Astrophysics
Scientific paper
Sep 1991
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1549..395f&link_type=abstract
In: EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93
Astronomy and Astrophysics
Astrophysics
Instrument Compensation, Microchannel Plates, Optical Materials, Radiation Detectors, X Ray Astrophysics Facility, Focal Plane Devices, Gas Flow, Windows
Scientific paper
The X-ray detection system used to calibrate the Advanced X-ray Astrophysics Facility (AXAF) mirrors will include gas flow and sealed proportional counters. To meet the ultimate 1 percent goal of the calibration project, the transmission and uniformity of the windows must be well known for the soft X-ray wavelengths involved. Various window materials for use with proportional counters are examined for transmission at X-ray wavelengths in the range of 0.1 to 5.9 keV. These include the usual window materials (polypropylene and beryllium), as well as materials only recently employed for detector applications (polyimide and diamond). The transmission uniformity of beryllium at 1.49 keV is examined with a microchannel plate detector, producing a 'shadowgraph' of the window material illuminated with soft X-rays. This technique allows us to investigate nonuniformities on a spatial scale of about .2 mm.
Austin Gerald K.
Cobuzzi J. P.
Flanagan Katherine
Goddard Richard
Hughes John Patrick
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