Uniform depth profiling of multiple sample depth ranges in a single step-scanning FT-IR photoacoustic experiment

Computer Science

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Energy-Conversion Spectro-Analytical Methods, Organic Compounds, Polymers

Scientific paper

Photoacoustic spectroscopy (PAS) depth profiling results are consistent with the known layer structure of a Paramount laminate film and an adhesive label. There is a clear relationship between the measured phase angle differences and individual layer thicknesses. At low modulation frequencies, deeper sample depths are probed and the phase-angle differences are smaller than at higher frequencies. Digital signal processing enables multiple depth ranges to be probed in a single experiment. Comparing different modulation-frequency results helps to verify the layer thickness estimates. PAS depth profiling is a viable approach when the top layer is either: 1) thin; or 2) not strongly absorbing in key regions of the IR spectrum where deeper layers absorb.

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