Two-wavelength heterodyne interferometer with extended measurement range

Details Two-wavelength heterodyne interferometer with extended measurement range Two-wavelength heterodyne interferometer with extended measurement range

Sep 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.1978..232b&link_type=abstract

Proc. SPIE Vol. 1978, p. 232-236, Coherent Measuring and Data Processing Methods and Devices, Valery I. Mandrosov; Ed.

Physics

Scientific paper

The article describes the circuit of a two-wavelength heterodyne interferometer operating in a spectral region of 10.6 micrometers and intended for control of the shape of the primary segment mirror of an infrared telescope. The experimental data obtained for a model of a three-element segment mirror is presented. The design of a two-wavelength interferometer to be used for aspherical mirrors testing and polished optical surfaces is proposed.

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