Two-dimensional measurement of birefringence disperion using spectroscopic polarized light

Details Two-dimensional measurement of birefringence disperion using spectroscopic polarized light Two-dimensional measurement of birefringence disperion using spectroscopic polarized light

Sep 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4919..176w&link_type=abstract

Advanced Materials and Devices for Sensing and Imaging. Edited by Yao, Jianquan; Ishii, Yukihiro. Proceedings of the SPIE, Volu

Physics

2

Scientific paper

This paper describes a method and system for two-dimensional measurement of birefringence dispersion with high-order and azimuthal direction. The system consists of a white light source, crossed polarizers and a detector carrying out the spectroscopic polarized light. A spectroscopic interferogram shows sinusoidaly in accordance with wave number change, and its period changes slightly because of dispersion of birefringence. The fast Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2-D birefringence dispersion distribution are shown for the demonstration of this method.

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