Two Comments in Deep Dielectric Charging

Physics – Plasma Physics

Scientific paper

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[7800] Space Plasma Physics, [7855] Space Plasma Physics / Spacecraft Sheaths, Wakes, Charging, [7914] Space Weather / Engineering For Hazard Mitigation, [7984] Space Weather / Space Radiation Environment

Scientific paper

We offer two comments in deep dielectric charging. First, it is commonly mentioned that daily fluence of high-energy (MeV) electrons is a good warning indicator for the probability of deep dielectric discharging. We suggest that, instead of daily fluence, continuous integration fluence of high-energy electrons would be a better indicator. For, depending on the conductivity of the dielectric material, the accumulation of deeply deposited high-energy electrons may rise rapidly to a critical level whereas the daily average may still be below the critical value. As a motto says, a feather can break the back of a camel. Second, we suggest using a stack of thin conducting plates separated by short distances inside dielectric materials for preventing deep dielectric charging. They can be connected to a single voltage for preventing high potential difference between the front and back of the dielectric material. Their potentials can also be floating so that the potential profile inside the material can be measured. A feasibility study will be presented.

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