Trapped-ion probing of light-induced charging effects on dielectrics

Details Trapped-ion probing of light-induced charging effects on dielectrics Trapped-ion probing of light-induced charging effects on dielectrics

2010-04-27

arxiv.org/abs/1004.4842v2

New J. Phys. 12 (2010) 093035

Physics

Quantum Physics

11 pages, 5 figures

Scientific paper

10.1088/1367-2630/12/9/093035

We use a string of confined $^{40}$Ca$^+$ ions to measure perturbations to a trapping potential which are caused by light-induced charging of an anti-reflection coated window and of insulating patches on the ion-trap electrodes. The electric fields induced at the ions' position are characterised as a function of distance to the dielectric, and as a function of the incident optical power and wavelength. The measurement of the ion-string position is sensitive to as few as $40$ elementary charges per $\sqrt{\mathrm{Hz}}$ on the dielectric at distances of order millimetres, and perturbations are observed for illumination with light of wavelengths as long as 729\,nm. This has important implications for the future of miniaturised ion-trap experiments, notably with regards to the choice of electrode material, and the optics that must be integrated in the vicinity of the ion. The method presented can be readily applied to the investigation of charging effects beyond the context of ion trap experiments.

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