Physics
Scientific paper
Oct 2011
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011jgra..11610306l&link_type=abstract
Journal of Geophysical Research, Volume 116, Issue A10, CiteID A10306
Physics
Electromagnetics: Instruments And Techniques, Ionosphere: Electric Fields (2712), Ionosphere: Ionosphere/Atmosphere Interactions (0335), Atmospheric Processes: Atmospheric Electricity, Atmospheric Processes: Lightning
Scientific paper
Charge moment change (ΔMQ) data were examined for 41 positive cloud-to-ground (+CG) lightning discharges that were parents of transient luminous events (TLEs; mainly sprites) over two different storms: 9 May (20 parents) and 20 June 2007 (21). Data were broken down by contributions from the impulse ΔMQ (iΔMQ), within the first 2 ms of the return stroke, and the ΔMQ from the continuing current (CC), which can last tens of ms afterward. Three-dimensional lightning mapping data provided positions for the in-cloud components of the parent +CGs. Charge and charge density neutralized by the strokes were estimated. The 20 June parents were more impulsive than 9 May, with increased iΔMQ and CC amplitude but reduced CC duration. Total ΔMQ values between the two storms were very similar, averaging ∼1800 C km. Estimated charge density on 20 June was nearly twice that on 9 May, consistent with the 20 June storm being more intense with a stronger electrical generator. Lightning metrics were analyzed for 9 high- iΔMQ (>300 C km) +CGs that did not produce an observable TLE on 20 June, and compared to that day's TLE parents. Non-TLE +CGs had reduced CC magnitudes and duration, with less total ΔMQ. Photogrammetric estimates of TLE azimuthal swaths were positively correlated with similar metrics of the in-cloud portions of the parent +CGs, as well with total ΔMQ. The implications of all these results for the ΔMQ theory of sprite initiation, and for the relationship between sprite development and in-cloud discharging, are discussed.
Cummer Steven A.
Lang Timothy J.
Li Jingbo
Lyons Walter A.
MacGorman Donald R.
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