Total integrated scatter instrument for in-space monitoring of surface degradation

Details Total integrated scatter instrument for in-space monitoring of surface degradation Total integrated scatter instrument for in-space monitoring of surface degradation

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1329..200p&link_type=abstract

IN: Optical system contamination: Effects, measurement, control II; Proceedings of the Meeting, San Diego, CA, July 10-12, 1990

Physics

Degradation, Earth Orbital Environments, Light Scattering, Oxygen Atoms, Specular Reflection, Surface Properties, Damage Assessment, Lambert Surface, Optical Properties, Surface Roughness

Scientific paper

A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.

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