Tolerance analysis of optical systems containing sampling devices

Details Tolerance analysis of optical systems containing sampling devices Tolerance analysis of optical systems containing sampling devices

Sep 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5962..359c&link_type=abstract

Building European OLED Infrastructure. Edited by Pearsall, Thomas P.; Halls, Jonathan. Proceedings of the SPIE, Volume 5962, p

Physics

Optics

Scientific paper

Numerous optical systems, such as telescopes, adaptive optics systems, and aberrometers, are equipped with wavefront sensors, which often use sampling devices measuring the slope of the wavefront at discrete points across the pupil (e.g. Shack-Hartmann sensors). The accuracy of the sampled output signal is always affected by the fabrication and alignment tolerances of the wavefront sensing optical system. Typically, it is a requirement to express the measurement error in terms of input wavefront, so the optical ray intercept error has to be converted into wavefront measurement error. This conversion cannot be obtained directly from a conventional tolerance analysis because of the wavefront breaking by the sampling device. The tolerancing method proposed in this paper solves the problem of converting conventional merit function degradation into input wavefront measurement error. The proposed method consists of two parts. First, a Monte Carlo tolerance analysis based on a specific merit function is performed, and a 90% border system is selected. Then, an optimization is applied to the 90% border system, by varying a "dummy" phase surface introduced at the entrance pupil of the system. A concrete example is presented.

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