TOF-SIMS Analysis of SiC Grains with High Lateral Resolution

Details TOF-SIMS Analysis of SiC Grains with High Lateral Resolution TOF-SIMS Analysis of SiC Grains with High Lateral Resolution

Mar 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997lpi....28.1371s&link_type=article

28th Annual Lunar and Planetary Science Conference, March 17-21, 1997, Houston, TX, p. 1371.

Physics

2

Spectrometry (Tof-Sims)

Scientific paper

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