Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy

Details Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy Time-varying tip-sample force measurements confirm steady-state dynamics in tapping-mode atomic force microscopy

2007-12-18

arxiv.org/abs/0712.2833v1

Phys.Rev.B77:115405,2008

Physics

Instrumentation and Detectors

16 pages including 3 figures

Scientific paper

10.1103/PhysRevB.77.115405

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the mathematical relationships describing the steady state dynamics are quantitatively satisfied by the independent measurements of tip-sample forces over a broad range of experimental conditions. These results confirm the existing understanding of the tapping-mode atomic force microscopy and build confidence on the reliability of time-varying tip-sample force measurements by the torsional harmonic cantilevers.

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