Physics
Scientific paper
Sep 1995
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2551..273s&link_type=abstract
Proc. SPIE Vol. 2551, p. 273-280, Photoelectronic Detectors, Cameras, and Systems, C. Bruce Johnson; Ervin J. Fenyves; Eds.
Physics
3
Scientific paper
We have investigated the thermal behavior of a set of 40 mm, high strip current, microchannel plate (MCP) photomultipliers developed for a diagnostic system of a fusion plasma by laser scattering. These detectors include a V-stack of very low resistivity (5 X 10(superscript 6) (Omega) m) microchannel plates and must be operated with a pulsed high voltage power supply under strict control of the temperature. Therefore the resistance of the V-stacks has been studied as a function of the MCP temperature and of the applied voltage by applying short pulses of high voltage to the detectors in a temperature comtrolled environment. At low applied voltage (approximately 1 V) a resistance of 2.05 X 10(superscript 6) (Omega) was measured for one of the V-stacks, with a resistance coefficient of -1.47 X 10(superscript 4) (Omega) /degrees C. At high voltage the resistance was found to be lower by about a factor three and showed a linear decrease with both the MCP temperature and the applied high voltage. From these measurements the detector thermal capacitance and thermal conductivity were found to be 0.79 J/degrees C and 1.85 X W/degrees C respectively. The measured parameters are used in a simplified thermal model of the detectors for the construction of the pulsed power supply control system necessary to operate them in safe conditions.
Bassan Michele
Giudicotti Leonardo
Lotto Luca
Pasqualotto Roberto
Sardella Andrea
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