Thermal behavior of a microphotodiode array

Details Thermal behavior of a microphotodiode array Thermal behavior of a microphotodiode array

Jan 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980apopt..19...86m&link_type=abstract

Applied Optics, vol. 19, Jan. 1, 1980, p. 86-91. In French.

Physics

Optics

1

Microelectronics, Photodiodes, Temperature Effects, Arrays, Dynamic Response, Heat Generation, Junction Diodes, Linear Systems, Recombination Reactions, Scanners, Transmission Efficiency

Scientific paper

The behavior of a self-scanned photodiode array when thermal generation-recombination effects are present has been studied. Experimental results show the validity of the step junction theoretical approach to this problem and that the linearity of the response in the presence of strong thermal contributions is well verified. A decrease is shown, however, in the slope of the response and in the dynamic range as a function of intrinsic concentration by integration time. An attempt to fit the experimental results with the predictions of the linear junction model (which provides for a nonlinear response) has given negative results. It is concluded that thermal effects do reduce the overall efficiency of this particular device but do not rule out its use as a linear detector.

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