Physics – Optics
Scientific paper
Feb 1991
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1343..319w&link_type=abstract
IN: X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego,
Physics
Optics
Extreme Ultraviolet Radiation, Satellite-Borne Instruments, Spectroheliographs, Ultraviolet Telescopes, X Ray Telescopes, Astronomical Photography, Astronomical Spectroscopy, High Resolution, Imaging Techniques, Space Station Freedom
Scientific paper
The phenomena to be studied with the Ultra-High Resolution XUV Spectroheliograph (UHRXS) which will be included into the instrumental load of the Space Station Freedom are discussed together with the characteristics of the nine multilayer Ritchey-Chretien telescopes constituting the UHRXS system. The telescopes will cover a spectral range from about 70 A to about 300 A. Each telescope will be able to isolate emission line multiplets excited over a narrow temperature range, providing images of diagnostic quality covering structures in the solar atmosphere ranging from T of about 50,000 K to 30,000,000 K. One of the nine UHRXS telescopes is configured as a coronagraph to allow observations to 6 solar radii beyond the solar limb. The paper presents an analysis of the expected sensitivity and resolving power of the UHRXS telescopes, and the diagnostic response of the various UHRXS instruments to structures in the solar atmosphere between 10,000 K and 100,000,000 K.
Allen Maxwell J.
Barbee Troy W. Jr.
DeForest Craig Edward
Gethyn Timothy J.
Kankelborg Charles
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