The STM view of the initial stages of polycrystalline Ag film formation

Physics

Scientific paper

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Scientific paper

The growth of Ag thin films deposited at 300 K on amorphised Si surfaces
under ultra high vacuum conditions is investigated by in situ scanning
tunnelling microscopy. The analysis of film morphology as a function of
film thickness together with additional annealing experiments allow a
quite complete picture of the film formation processes to be obtained.

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