The Single Event Upset (SEU) response to 590 MeV protons

Physics

Scientific paper

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Chips (Memory Devices), Nuclear Reactions, Proton Impact, Radiation Effects, Random Access Memory, Aerospace Environments, Cosmic Rays, Electronic Equipment Tests, Energetic Particles, Environmental Tests, Radiation Belts, Solar Activity Effects

Scientific paper

The presence of high-energy protons in cosmic rays, solar flares, and trapped radiation belts around Jupiter poses a threat to the Galileo project. Results of a test of 10 device types (including 1K RAM, 4-bit microP sequencer, 4-bit slice, 9-bit data register, 4-bit shift register, octal flip-flop, and 4-bit counter) exposed to 590 MeV protons at the Swiss Institute of Nuclear Research are presented to clarify the picture of SEU response to the high-energy proton environment of Jupiter. It is concluded that the data obtained should remove the concern that nuclear reaction products generated by protons external to the device can cause significant alteration in the device SEU response. The data also show only modest increases in SEU cross section as proton energies are increased up to the upper limits of energy for both the terrestrial and Jovian trapped proton belts.

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