The noise-limited-resolution for stimulated emission depletion microscopy

Details The noise-limited-resolution for stimulated emission depletion microscopy The noise-limited-resolution for stimulated emission depletion microscopy

2009-08-12

arxiv.org/abs/0908.1678v3

Physics

Optics

6 pages 2 figures

Scientific paper

With recent developments in microscopy, such as stimulated emission depletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we show that, in the special case of a diffusive regime, the noise-limited resolution of STED imaging is independent of the saturation intensity of the fluorescent label. Thermal motion limits the signal integration time, which, for a given excited-state lifetime, limits the total number of photons available for detection.

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