The Huygens SSP Refractometer (REF)

Details The Huygens SSP Refractometer (REF) The Huygens SSP Refractometer (REF)

Apr 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992esasp.338..343g&link_type=abstract

In ESA, Symposium on Titan p 343-346 (SEE N92-32348 23-91)

Computer Science

1

Optical Properties, Refractometers, Satellite Atmospheres, Space Probes, Titan, Ethane, Liquefied Gases, Methane, Surface Layers

Scientific paper

The refractometer in the Huygens probe Surface Science Package (SSP) is a linear critical angle refractometer. Its optical principles, instrument construction, and details of its electronic system are described. This instrument covers the refractive index range 1.250 to 1.450 with a discrimination of 0.001; this gives a resolution of better than 1 percent in the relative abundance of methane and ethane in the expected mixture on the liquid surface of Titan. Light emitting diodes at 635 nm provide illumination; the ouput image shows a cutoff edge, whose position is a linear function of refractive index. The image intensity profile is sensed by a 512 element photodiode array and digitized; it is then differentiated numerically by the SSP's central computer, as this is found to enhance the discrimination and may give information about any suspended matter.

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