Test methodologies for linear longwave infrared detector array production

Details Test methodologies for linear longwave infrared detector array production Test methodologies for linear longwave infrared detector array production

May 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2474..283w&link_type=abstract

Proc. SPIE Vol. 2474, p. 283-294, Smart Focal Plane Arrays and Focal Plane Array Testing, Marc Wigdor; Mark A. Massie; Eds.

Computer Science

Performance

Scientific paper

We describe in this paper a flow process that details design, fabrication, and test methodologies for the production of linear longwave infrared (LWIR) HgCdTe (MCT) detector arrays. The modular manufacturing approach emphasizes testability in the component design and zero-loss procedure in the FPA assembly that achieved reliable, low-cost production of high performance scanning LWIR focal plane arrays. In-depth theory, practice, and automation of infrared detector array evaluation are also discussed.

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