Surface analysis of space telescope material specimens

Details Surface analysis of space telescope material specimens Surface analysis of space telescope material specimens

Jun 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985aubu.rept.....f&link_type=abstract

Final Report Auburn Univ., AL. Dept. of Physics.

Physics

Earth Orbital Environments, Hubble Space Telescope, Monatomic Gases, Oxygen, Structural Members, Backscattering, Ellipsometers, Space Shuttle Mission 41-G

Scientific paper

Qualitative and quantitative data on Space Telescope materials which were exposed to low Earth orbital atomic oxygen in a controlled experiment during the 41-G (STS-17) mission were obtained utilizing the experimental techniques of Rutherford backscattering (RBS), particle induced X-ray emission (PIXE), and ellipsometry (ELL). The techniques employed were chosen with a view towards appropriateness for the sample in question, after consultation with NASA scientific personnel who provided the material specimens. A group of eight samples and their controls selected by NASA scientists were measured before and after flight. Information reported herein include specimen surface characterization by ellipsometry techniques, a determination of the thickness of the evaporated metal specimens by RBS, and a determination of trace impurity species present on and within the surface by PIXE.

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