Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction

Physics

Scientific paper

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

2

Scientific paper

Palladium (Pd) films have been grown and characterized in situ by low-energy electron diffraction (LEED) and microscopy in two different regimes: ultrathin films 2-6 monolayers (ML) thick on Ru(0001), and ~20 ML thick films on both Ru(0001) and W(110). The thinner films are grown at elevated temperature (750 K) and are lattice matched to the Ru(0001) substrate. The thicker films, deposited at room temperature and annealed to 880 K, have a relaxed in-plane lattice spacing. All the films present an fcc stacking sequence as determined by LEED intensity versus energy analysis. In all the films, there is hardly any expansion in the surface-layer interlayer spacing. Two types of twin-related stacking sequences of the Pd layers are found on each substrate. On W(110) the two fcc twin types can occur on a single substrate terrace. On Ru(0001) each substrate terrace has a single twin type and the twin boundaries replicate the substrate steps.

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for scientists and scientific papers. Rate them and share your experience with other people.

Rating

Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structure of ultrathin Pd films determined by low-energy electron microscopy and diffraction will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFWR-SCP-O-1105613

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.