Spectroscopic Ellipsometry of Gold Clusters Embedded in Thin Dielectric Films

Details Spectroscopic Ellipsometry of Gold Clusters Embedded in Thin Dielectric Films Spectroscopic Ellipsometry of Gold Clusters Embedded in Thin Dielectric Films

Apr 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007aipc..899..803t&link_type=abstract

SIXTH INTERNATIONAL CONFERENCE OF THE BALKAN PHYSICAL UNION. AIP Conference Proceedings, Volume 899, pp. 803-803 (2007).

Physics

Dielectric Thin Films, Composite Materials, Optical Constants

Scientific paper

Thin dielectric films of different materials (SiO2 and Al2O3) with embedded gold nanoclusters were deposited by magnetron co-sputtering. The influence of the gold nanoclusters concentration and the host matrix material on the optical response of the system was studied by spectroscopic ellipsometry (SE) in the 450 nm÷700 nm spectral range.

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