Soft X-ray Polarimetry Laboratory Results

Physics – Optics

Scientific paper

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Scientific paper

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. We will present progress on laboratory work to demonstrate the capabilities of key components.
This work has been supported in part under a MIT Kavli Institute instrumentation development grant.

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