Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions

Details Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions

Sep 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2518..258l&link_type=abstract

Proc. SPIE Vol. 2518, p. 258-267, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, Oswald H. Siegmund; John V. Valler

Astronomy and Astrophysics

Astronomy

5

Scientific paper

Measurements are presented on the x ray response of superconducting tunnel junction (STJ) detectors, over the energy range of 50 - 1800 eV. This includes the measurement of the lowest x-ray energies published to date. Energy resolution and response linearity is measured as a function of device geometry. It is shown that self-recombination of quasi-particles leads to an energy non-linearity which depends on junction volume. The effect of count rate limitations on energy resolution is established for rates up to 10 kHz.

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