Smart pyrometry for combined sample temperature and reflectance measurements in molecular-beam epitaxy

Details Smart pyrometry for combined sample temperature and reflectance measurements in molecular-beam epitaxy Smart pyrometry for combined sample temperature and reflectance measurements in molecular-beam epitaxy

May 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000jvstb..18.1426b&link_type=ejournal

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 18, issue 3, p. 1426

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