Single-electron shuttle based on a silicon quantum dot

Details Single-electron shuttle based on a silicon quantum dot Single-electron shuttle based on a silicon quantum dot

2011-03-30

arxiv.org/abs/1103.5891v3

Appl. Phys. Lett. 98, 212103 (2011)

Physics

Quantum Physics

Scientific paper

10.1063/1.3593491

We report on single-electron shuttling experiments with a silicon metal-oxide-semiconductor quantum dot at 300 mK. Our system consists of an accumulated electron layer at the Si/SiO_2 interface below an aluminum top gate with two additional barrier gates used to deplete the electron gas locally and to define a quantum dot. Directional single-electron shuttling from the source and to the drain lead is achieved by applying a dc source-drain bias while driving the barrier gates with an ac voltage of frequency f_p. Current plateaus at integer levels of ef_p are observed up to f_p = 240 MHz operation frequencies. The observed results are explained by a sequential tunneling model which suggests that the electron gas may be heated substantially by the ac driving voltage.

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