Simultaneous Topography and Tomography of Micro-structures using Full-field Swept-source Optical Coherence Tomography

Details Simultaneous Topography and Tomography of Micro-structures using Full-field Swept-source Optical Coherence Tomography Simultaneous Topography and Tomography of Micro-structures using Full-field Swept-source Optical Coherence Tomography

Apr 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010aipc.1236..155a&link_type=abstract

INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING. AIP Conference Proceedings, Volume 1236,

Physics

Optics

Fourier Transform Optics, Light Coherence, Michelson Interferometers, Semiconductor Diodes, Refractive Index, Fourier Optics, Coherence, Holographic Interferometry, Other Holographic Techniques, Diode-Pumped Lasers, Optical Constants

Scientific paper

A full-field swept source optical coherence tomographic (FF-SS-OCT) system has been reported for the simultaneous topography and tomography of the microstructures. Our optical set-up includes a swept-source which is a combination of super-luminescent diode (SLD) and acousto-optic tunable filter (AOTF), a compact Michelson interferometer and an area detector (CCD). Interference fringe signal was recorded by tuning the wavelength in a regular interval and fringe analysis was done by using Fourier-transform technique. By means of computing the inverse Fourier transform of the interference fringe signal both optically sectioned images (amplitude) and phase map of the microstructures were obtained. The present system is completely non-mechanical scanning, highly stable and very cost effective due to which it can be explored for many scientific and engineering applications.

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