Short-period x-ray multilayers

Details Short-period x-ray multilayers Short-period x-ray multilayers

Jun 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3406...70a&link_type=abstract

Proc. SPIE Vol. 3406, p. 70-79, Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Ear

Physics

Optics

Scientific paper

Ultrathin Cr/Sc-multilayers were systematically investigated using tuneable soft x-ray synchrotron and x-ray tube radiation. The multilayers were optimized either for use in normal incidence or at 45 degrees at photon energies around the L-absorption edges of Sc (399 eV) and Cr (574 eV), respectively, and K-absorption edge of C (283 eV). The high reflectivity of the multilayer mirrors allows to use them for the creation of multi-mirror systems for x-ray astronomy and microscopy and x-ray diagnostics of high-temperature plasma.

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