Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV)

Details Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV) Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV)

2012-02-06

arxiv.org/abs/1202.1197v1

Physics

Plasma Physics

7 pages, 2 figures

Scientific paper

Phosphor imaging plates (IPs) have been calibrated and proven useful for quantitative x-ray imaging in the 1 to over 1000 keV energy range. In this paper we report on calibration measurements made at XUV energies in the 60 to 900 eV energy range using beamline 6.3.2 at the Advanced Light Source at Lawrence Berkeley National Laboratory. We measured a sensitivity of ~25 plus or minus 15 counts/pJ over the stated energy range which is compatible with the sensitivity of Si photodiodes that are used for time-resolved measurements. Our measurements at 900 eV are consistent with the measurements made by Meadowcroft et al. at ~1 keV.

Affiliated with

Also associated with

No associations

Rating

Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV) does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV), we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sensitivity of an image plate system in the XUV (60 eV < E < 900 eV) will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-119819