Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Details Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Jul 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3115..336l&link_type=abstract

Proc. SPIE Vol. 3115, p. 336-340, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, Richard B. Hoover; F. Pat

Physics

Optics

Scientific paper

Researchers at Digirad Corporation have developed an innovative method for eliminating the effects of hole trapping in radiation detectors made from compound semiconductors such as CdTe or CdZnTe. The technique involves no additional electronics. Working devices have been manufactured in a variety of configurations including imaging arrays. This paper presents results from some simple structures.

Affiliated with

Also associated with

No associations

Rating

Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1417653