Self-referenced prism deflection measurement schemes with microradian precision

Details Self-referenced prism deflection measurement schemes with microradian precision Self-referenced prism deflection measurement schemes with microradian precision

2005-09-30

arxiv.org/abs/physics/0509264v1

Appl. Opt., 44, 4639-4647 (Aug 2005)

Physics

Optics

10 pages, 9 figures

Scientific paper

10.1364/AO.44.004639

We have demonstrated several inexpensive methods which can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, using various reversals to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our lab to characterize parallel-plate beamsplitters, penta prisms, right angle prisms, and corner cube reflectors using only components typically available in an optics lab.

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