Physics – Instrumentation and Detectors
Scientific paper
2005-06-27
Conf.Proc.C0505161:2821,2005
Physics
Instrumentation and Detectors
paper RPAT044 accepted to Proc. 2005 Particle Accelerator Conference
Scientific paper
We present recent beam data from a new design of a profile monitor for proton
beams at Fermilab. The monitors, consisting of grids of segmented Ti foils
5micrometers thick, are secondary-electron emission monitors (SEM's). We review
data on the device's precision on beam centroid position, beam width, and on
beam loss associated with the SEM material placed in the beam.
Baller B.
Childress Stephen
Ford Richard
Harris Dan
Indurthy D.
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