Secondary Electron Yield Measurements of TiN Coating and TiZrV Getter Film

Details Secondary Electron Yield Measurements of TiN Coating and TiZrV Getter Film Secondary Electron Yield Measurements of TiN Coating and TiZrV Getter Film

2003-10-15

arxiv.org/abs/physics/0310071v2

Physics

Accelerator Physics

14 pages, 16 figures

Scientific paper

In the beam pipe of the positron Main Damping Ring (MDR) of the Next Linear Collider (NLC), ionization of residual gases and secondary electron emission give rise to an electron cloud which can cause the loss of the circulating beam. One path to avoid the electron cloud is to ensure that the vacuum wall has low secondary emission yield and, therefore, we need to know the secondary emission yield (SEY) for candidate wall coatings. We report on SEY measurements at SLAC on titanium nitride (TiN) and titanium-zirconium-vanadium (TiZrV) thin sputter-deposited films, as well as describe our experimental setup.

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