Physics – Atomic Physics
Scientific paper
2007-10-25
Nucl.Instrum.Meth.B263:518-522,2007
Physics
Atomic Physics
6 pages, 8 figures
Scientific paper
10.1016/j.nimb.2007.06.021
Measurements have been performed of scintillation light intensities emitted from various inorganic scintillators irradiated with low-energy beams of highly-charged ions from an electron beam ion source (EBIS) and an electron cyclotron resonance ion source (ECRIS). Beams of xenon ions Xe$^{q+}$ with various charge states between $q$=2 and $q$=18 have been used at energies between 5 keV and 17.5 keV per charge generated by the ECRIS. The intensity of the beam was typically varied between 1 and 100 nA. Beams of highly charged residual gas ions have been produced by the EBIS at 4.5 keV per charge and with low intensities down to 100 pA. The scintillator materials used are flat screens of P46 YAG and P43 phosphor. In all cases, scintillation light emitted from the screen surface was detected by a CCD camera. The scintillation light intensity has been found to depend linearly on the kinetic ion energy per time deposited into the scintillator, while up to $q$=18 no significant contribution from the ions' potential energy was found. We discuss the results on the background of a possible use as beam diagnostics e.g. for the new HITRAP facility at GSI, Germany.
Ernst H.
Kester O.
Vogel Manfred
Winters D. F. A.
Zimmermann Horst
No associations
LandOfFree
Scintillation light produced by low-energy beams of highly-charged ions does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Scintillation light produced by low-energy beams of highly-charged ions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scintillation light produced by low-energy beams of highly-charged ions will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-433013