Scanning electron microscope/energy dispersive x ray analysis of impact residues in LDEF tray clamps

Details Scanning electron microscope/energy dispersive x ray analysis of impact residues in LDEF tray clamps Scanning electron microscope/energy dispersive x ray analysis of impact residues in LDEF tray clamps

Apr 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993ldef.symp..541b&link_type=abstract

In NASA. Langley Research Center, LDEF: 69 Months in Space. Second Post-Retrieval Symposium, Part 2 p 541-549 (SEE N93-29354 11-

Physics

Clamps, Electron Microscopes, Long Duration Exposure Facility, Meteorites, Residues, Trays, X Ray Analysis, Hypervelocity Projectiles, Inspection, Meteorite Craters, Meteoritic Damage, Projectile Cratering

Scientific paper

Detailed optical scanning of tray clamps is being conducted in the Facility for the Optical Inspection of Large Surfaces at JSC to locate and document impacts as small as 40 microns in diameter. Residues from selected impacts are then being characterized by Scanning Electron Microscopy/Energy Dispersive X-ray Analysis at CNES. Results from this analysis will be the initial step to classifying projectile residues into specific sources.

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