SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories

Details SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories

2009-07-17

arxiv.org/abs/0907.3131v1

Physics

Atomic and Molecular Clusters

16 pages, no figures

Scientific paper

The SAXS (small angle X-ray scattering) technique has been used to determine
the fundamental structure of conducting thin films fabricated by implanting
gold ions into PMMA (polymethylmethacrylate) polymer. We present a brief review
of the SAXS theories necessary to determine the structural properties of our
nanoheterogeneous films.

Affiliated with

Also associated with

No associations

Rating

SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SAXS Structural Characterization of Nanoheterogeneous Conducting Thin Films. A Brief Review of SAXS Theories will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-111173