Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity

Details Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity

Oct 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001gecoa..65.3459t&link_type=ejournal

Geochimica et Cosmochimica Acta, v. 65, iss. 20, p. 3459-3474.

Physics

10

Scientific paper

Not Available

Affiliated with

Also associated with

No associations

Rating

Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Resolving orthoclase dissolution processes with atomic force microscopy and X-ray reflectivity will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1106217