Physics
Scientific paper
Feb 2011
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011spie.7928e....g&link_type=toc
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X. Edited by Garcia-Blanco, Sonia; Ramesham
Physics
Scientific paper
Not Available
Garcia-Blanco Sonia
Ramesham Rajeshuni
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