Reflectivity and scattering measurements of an Advanced X-ray Astrophysics Facility test coating sample

Physics – Optics

Scientific paper

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X-Rays, X-Ray Optics, Reflectivity, Scattering, Coatings, Mirrors

Scientific paper

Reflectivity and scattering profile measurements were made on a gold-coated witness sample produced to evaluate mirror coatings for the Advanced X-ray Astrophysics Facility program. Reflectivity measurements were made at Al K, Ti K, and Cu K energies as a function of incident graze angle. The results are fit to a model that includes the effects of roughness, particulate and organic contamination layers, and gold-coating density. Reflectivities are close to theoretical, with the difference being well accounted for by 4.1 A of roughness at spatial frequencies above 4 mu m-1, a gold-coating density equal to 0.98 bulk, and a surface contaminant layer 27 A thick. Scattering measurements extending to +/-35 arcmin of the line center were obtained by the use of Al K x rays and incidence angles from 0.75 deg to 3 deg The scattering profiles imply a power spectral density of surface-scattering frequencies that follows a power law with an index of -1.0 and a total surface roughness for the spatial frequency band between 0.05 mu m-1 and 4 mu m -1 of 3.3 A. Combining the roughnesses derived from both the reflectivity and scattering measurements yields a total roughness of 5.3 A for scattering frequencies between 0.05 mu m-1 and 15,000 mu m-1.

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