REE diffusivities in melilite - A preliminary study using the SIMS depth profile method

Physics

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Rare Earth Elements, Diffusivity, Mass Spectroscopy, Single Crystals, Calcium Oxides, Magnesium Oxides, Silicon Oxides, Activation Energy

Scientific paper

Diffusivities of the rare earth elements (REE), La, Pr, Tb and Tm, have been measured for synthetic single crystal of melilite (kermanite, Ca2MgSi2O7) using depth profile method by secondary ion mass spectrometry (SIMS), for the purpose of confirming the possible diffusive fractionation of REE in the Allende CAIs, etc. In our previous works, we have measured the diffusivities of divalent cations and REE (Gd, Tm, and Sc) in kermanite using radioactive tracers. However, tracer experiment is limited by availability of radioactive isotopes with half-lives and half-ray energies which are adequate for diffusion measurement. By using SIMS, any REE can be measured in principle, unless an oxide ion interferes measurement of metal ion with the same mass number. In addition, SIMS has higher spatial resolution (of a few nm rather than m) in tracer experiments or EPMA.

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