Reduced silicon in lunar regolith

Details Reduced silicon in lunar regolith Reduced silicon in lunar regolith

Aug 1977

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1977dossr.235.1410d&link_type=abstract

Akademiia Nauk SSSR, Doklady, vol. 235, Aug. 21, 1977, p. 1410-1412. In Russian.

Other

Geochemistry, Lunar Composition, Lunar Soil, Silicon, Abundance, Electron Energy, Lunar Surface, Nuclear Binding Energy, Photoelectron Spectroscopy, X Ray Spectroscopy

Scientific paper

X-ray photoelectron spectroscopy was used in a detailed investigation of the chemical, structural, and other properties of lunar silicon, using regolith samples returned from three areas on the lunar surface. Fractions of less than 83 microns and less than 74 microns were used in the analysis. The energy distribution of silicon 2p-electrons in regolith samples from the three areas is diagrammed and is studied both at the surface and in the bulk of the regolith particles. The reduced form of silicon decreases with depth, however, the depth at which reduced silicon vanishes differs for the three groups of samples (1000, 700, and 300 A, respectively).

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