Radiation Hardness of CCD Vertex Detectors for the ILC

Details Radiation Hardness of CCD Vertex Detectors for the ILC Radiation Hardness of CCD Vertex Detectors for the ILC

2006-11-28

arxiv.org/abs/physics/0611272v1

Physics

Instrumentation and Detectors

7 pages, 10 figures. Presented at the IEEE 2006 Nuclear Science Symposium, San Diego, USA, and the 10th Topical Seminar on Inn

Scientific paper

10.1016/j.nuclphysbps.2007.08.06

Results of detailed simulations of the charge transfer inefficiency of a prototype CCD chip are reported. The effect of radiation damage in a particle detector operating at a future accelerator is studied by examining two electron trap levels, 0.17 eV and 0.44 eV below the bottom of the conduction band. Good agreement is found between simulations using the ISE-TCAD DESSIS program and an analytical model for the 0.17 eV level. Optimum operation is predicted to be at about 250 K where the effect of the traps is minimal which is approximately independent of readout frequency. This work has been carried out within the Linear Collider Flavour Identification (LCFI) collaboration in the context of the International Linear Collider (ILC) project.

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