Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments

Details Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments

2005-09-20

arxiv.org/abs/nucl-ex/0509026v1

Nucl.Instrum.Meth. A558 (2006) 504-510

Physics

Nuclear Physics

Nuclear Experiment

12 pages, 13 figures, will be submitted to NIM

Scientific paper

10.1016/j.nima.2005.12.024

The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits.

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