Pseudoscopic imaging in a double diffraction process with a slit: critical point properties

Details Pseudoscopic imaging in a double diffraction process with a slit: critical point properties Pseudoscopic imaging in a double diffraction process with a slit: critical point properties

2006-07-07

arxiv.org/abs/physics/0607057v2

Journal of the Optical Society of America A-Optics Image Science and Vision 23 [5], 1021-1026, 2006; http://josaa.osa.org/ab

Physics

Optics

26 pages,13 figures

Scientific paper

10.1364/JOSAA.23.001021

Pseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions.

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