Physics
Scientific paper
Oct 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2274..204h&link_type=abstract
Proc. SPIE Vol. 2274, p. 204-208, Infrared Detectors: State of the Art II, Randolph E. Longshore; Ed.
Physics
Scientific paper
The rates of growth on oxide films on polished Hg(subscript 1-x)Cd(subscript x)Te surfaces exposed to room air are obtained by measuring the ellipticity of polarized light reflected from the surfaces with the ellipsometer. Plots of thickness vs. the logarithm of the time in room air are linear after about 1500 minutes with slopes of 15 angstroms/decade. Immediately after polishing the native oxide film is proximately 10 angstroms thick and increase in thickness by about 36 angstroms after one week. Measurements utilizing polarized light are made of the increase in film thickness with time on Hg(subscript 1-x)Cd(subscript x)Te surfaces immersed in water. The regular of the anodization voltage versus time was given. With ellipsometer, the thickness of anodic oxides film grown on Hg(subscript 1-x)Cd(subscript x)Te is determined. Further details and discussion will be presented.
Fang Jiaxiong
Hu Xiaoning
Hu Xierong
Jiang Runqing
Li Xiangyang
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